HTL Co. India Pvt. Ltd.

Semiconductor & Equipment Solutions

Mercury Precision coordinate measuring tool

Ultra-High Accuracy Measurement for FPD Photomasks

Mercury is a state-of-the-art precision coordinate measuring system developed for photomasks used in Flat Panel Display (FPD) manufacturing. Designed to meet the strict accuracy demands of advanced display technologies, Mercury delivers exceptional dimensional measurement and coordinate precision.

By combining advanced optomechatronics, nanometer-level positioning control, and environmental stabilization, Mercury achieves world-class measurement accuracy and reproducibility.

Product Specifications

Product Overview

Mercury enables fully automatic, high-precision measurement of critical photomask dimensions, including line width, aperture size, pitch, and coordinate positions. Its robust mechanical design and advanced calibration technology ensure reliable results even for large-format photomasks.

The system is optimized for production environments where accuracy, repeatability, and stability are essential.

Specialty

  • Air sliders and measuring tables with high positioning accuracy and high flatness

  • Laser interferometer and linear encoder to control table position in nanometers

  • Thermal chamber to minimize environmental changes, etc.

  • These state-of-the-art optomechatronics enable us to achieve the world’s highest level of measurement accuracy.

  • In addition, accuracy calibration with original measurement software and reference mask, error factors are completely corrected, an ideal grid coordinate system is constructed, and excellent measurement accuracy and reproducibility are guaranteed.

Supported Photomask Size

  • Photomask Size:G10
  • Customization: Available based on application requirements

Applications

Mercury is ideal for:

  • FPD photomask inspection and qualification
  • Display manufacturing quality control
  • Precision coordinate verification
  • Advanced panel technologies (LCD, OLED, Micro-LED)
  • R&D and high-accuracy metrology environments

Benefits to Your Workflow

  • Exceptional accuracy: Nanometer-level coordinate control
  • High reproducibility: Stable, calibrated measurement results
  • Environmental reliability: Reduced thermal and ambient influence
  • Automation-ready: Faster measurement with minimal operator dependency
  • Scalable capability: Supports large-format photomasks up to G10

Catalog

Technical Overview

Specification

Typical Value

Imprint Modes

Thermal (up to 250 °C) / UV (365 nm or 405 nm)

Substrate Size

Up to Ø120 mm or Ø210 mm

Minimum Feature Size

~100 nm

Supported Materials

Thermoplastics, UV resists, glass, silicon, polymers

Operation

Manual or semi-automated

System Size

Compact desktop configuration

Configuration Options

20+ variants for chamber, UV source, and control interface

Contact us to

Request a demo or sample imprint

Discuss your application needs

Get configuration and pricing details

HTL Co. India Pvt. Ltd.

Semiconductor & Equipment Solutions

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